9:00 – 9:30
9:30 – 11:00
9:30 – 10:00
11:00 – 11:30
11:30 – 12:30
12:30 – 13:30
14:00 – 16:00
14:00 – 14:30
18:00 – 22:00
OPENING
SESSION I
Wide Bandgap Materials
–
Keynote speaker: Marilena VIVONA
Annealing process in SiC Power Device Technology
– J. Tarenko, M. Kamiński, O. Sadowski, J. Wierzbicka, A. Gołębiowska, V. Gao Zhan, A. Szerling,
K. Król, P. Prystawko, M. Boćkowski,
I. Grzegory and A. Taube
Etched Junction Termination Techniques for Gallium Nitride Vertical Power Devices
– W. Hendzelek, J. Wierzbicka, A. Gołębiowska, O. Sadowski, A. Wójcicka, J. Tarenko, M. Kamiński,
V. Gao Zhan, J. Jankowska-Śliwińska,
K. Urbanowski, A. Szerling and A. Taube
Application of p-NiO Layers in Technology of AlGaN/GaN High Electron Mobility Transistors
– M. Kamiński and K. Król
Breakdown voltage in bevel mesa GaN pin diode analysis
Coffee Break
SESSION II
Technology and Materials
– J. Rymarczyk, I. Stępińska, M. Kozłowski and R. Diduszko
Nanocomposites Based On Copper and Zinc Oxides with Various Crystalline Structures – Synthesis, Characterization, and Application
– D. Janczak, K. Wójkowska, T. Raczyński, S. Lepak-Kuc, A. Kądziela and M. Jakubowska
Multi-Functional Composite Materials for Flexible and Wearable Electronics
– N. Bokla, T. Klymkovych, A. Kubiak and Ł. Ruta
Prototyping an Acoustofuidic Lab-on-Chip Structure for Efficient Microparticles Separation
Lunch
SESSION III
Metrology and control of thermal phenomena at micro- and nanoscale
–
Keynote speaker: James POMEROY
Thermal management and characterization of advanced semiconductor electronics
– T. Gotszalk, E. Gacka, B. Pruchnik, P. Kunicki, K. Kwoka, T. Piasecki, I. W. Rangelow, A. Sierakowski,
I. Striclin and T. Busani
Heat phenomena during field emission-nanometrology of Nottingham effect
– T. Piasecki, J. Pruchnik, B. Pruchnik, P. Prokaryn, R. Dobrowolski, A. Sierakowski, P. Kolasiński,
T. Duraziński and T. Gotszalk
QEChemMEMS – towards measuring the heat from the electrochemical reaction
– D. Badura, B. Pruchnik, I. Rangelow and T. Gotszalk
Thermomechanical high speed actuation of MEMS devices
– B. Pruchnik, D. Badura, P. Smagowski, T. Piasecki, P. Putek, P. Janus, A. Sierakowski and T.
Gotszalk
Scanning thermal microscopy-high resolution method to investigate thermal phenomena at the nanoscale
– P. Janus, A. Sierakowski, R. Dobrowolski, A. Łaszcz, M. Rudek, B. Pruchnik and T. Gotszalk
Active piezoresistive cantilevers for Scanning Thermal Microscopy
– Anatoliy Onanko, Lyudmyla Kuzmych and Yurii Onanko
Temperature Mechanical Spectroscopy of GeSi, Si, Nanocomposites of Multiwalled Carbon Nanotubes and Polymers
Welcome Party