9:00 – 9:30
9:30 – 11:00
11:00 – 11:30
11:30 – 12:30
12:30 – 13:30
13:30 – 16:00
18:00 – 22:00
OPENING
SESSION I
Wide Bandgap Materials
Chairman: Mariusz SOCHACKI
–
Keynote speaker: Marilena VIVONA
Annealing process in SiC Power Device Technology
– M. Kamiński and K. Król
Breakdown voltage in bevel mesa GaN pin diode analysis
– W. Hendzelek, J. Wierzbicka, A. Gołębiowska, O. Sadowski, A. Wójcicka, J. Tarenko, M. Kamiński,
V. Gao Zhan, J. Jankowska-Śliwińska,
K. Urbanowski, A. Szerling and A. Taube
Application of p-NiO Layers in Technology of AlGaN/GaN High Electron Mobility Transistors
– J. Tarenko, M. Kamiński, O. Sadowski, J. Wierzbicka, A. Gołębiowska, V. Gao Zhan, A. Szerling, K. Król, P. Prystawko, M. Boćkowski,
I. Grzegory and A. Taube
Etched Junction Termination Techniques for Gallium Nitride Vertical Power Devices
Coffee Break
SESSION II
Technology and Materials
Chairman: Małgorzata JAKUBOWSKA
– J. Rymarczyk, I. Stępińska, M. Kozłowski and R. Diduszko
Nanocomposites Based On Copper and Zinc Oxides with Various Crystalline Structures – Synthesis, Characterization, and Application
– D. Janczak, K. Wójkowska, T. Raczyński, S. Lepak-Kuc, A. Kądziela and M. Jakubowska
Multi-Functional Composite Materials for Flexible and Wearable Electronics
– N. Bokla, T. Klymkovych, A. Kubiak and Ł. Ruta
Prototyping an Acoustofuidic Lab-on-Chip Structure for Efficient Microparticles Separation
Lunch
SESSION III
Metrology and control of thermal phenomena at micro- and nanoscale
Chairman: Tomasz PIASECKI
–
Keynote speaker: James POMEROY
Thermal management and characterization of advanced semiconductor electronics
– T. Gotszalk, E. Gacka, B. Pruchnik, P. Kunicki, K. Kwoka, T. Piasecki, I. W. Rangelow, A. Sierakowski,
I. Striclin and T. Busani
Heat phenomena during field emission-nanometrology of Nottingham effect
– T. Piasecki, J. Pruchnik, B. Pruchnik, P. Prokaryn, R. Dobrowolski, A. Sierakowski, P. Kolasiński,
T. Duraziński and T. Gotszalk
QEChemMEMS – towards measuring the heat from the electrochemical reaction
Coffee Break
– D. Badura, B. Pruchnik, I. Rangelow and T. Gotszalk
Thermomechanical high speed actuation of MEMS devices
– B. Pruchnik, D. Badura, P. Smagowski, T. Piasecki, P. Putek, P. Janus, A. Sierakowski and T. Gotszalk
Scanning thermal microscopy-high resolution method to investigate thermal phenomena at the nanoscale
– P. Janus, A. Sierakowski, R. Dobrowolski, A. Łaszcz, M. Rudek, B. Pruchnik and T. Gotszalk
Active piezoresistive cantilevers for Scanning Thermal Microscopy
Welcome Party